Precision Metrology Using Weak Measurements

Lijian Zhang, Animesh Datta, and Ian A. Walmsley
Phys. Rev. Lett. 114, 210801 – Published 27 May 2015
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Abstract

Weak values and measurements have been proposed as a means to achieve dramatic enhancements in metrology based on the greatly increased range of possible measurement outcomes. Unfortunately, the very large values of measurement outcomes occur with highly suppressed probabilities. This raises three vital questions in weak-measurement-based metrology. Namely, (Q1) Does postselection enhance the measurement precision? (Q2) Does weak measurement offer better precision than strong measurement? (Q3) Is it possible to beat the standard quantum limit or to achieve the Heisenberg limit with weak measurement using only classical resources? We analyze these questions for two prototypical, and generic, measurement protocols and show that while the answers to the first two questions are negative for both protocols, the answer to the last is affirmative for measurements with phase-space interactions, and negative for configuration space interactions. Our results, particularly the ability of weak measurements to perform at par with strong measurements in some cases, are instructive for the design of weak-measurement-based protocols for quantum metrology.

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  • Received 17 October 2013

DOI:https://doi.org/10.1103/PhysRevLett.114.210801

© 2015 American Physical Society

Authors & Affiliations

Lijian Zhang1,2,3,*, Animesh Datta4,5, and Ian A. Walmsley5

  • 1National Laboratory of Solid State Microstructures and College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China
  • 2Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China
  • 3Max Planck Institute for Structure and Dynamics of Material, Hamburg 22761, Germany
  • 4Department of Physics, University of Warwick, Coventry CV4 7AL, United Kingdom
  • 5Clarendon Laboratory, Department of Physics, University of Oxford, Oxford OX1 3PU, United Kingdom

  • *lijian.zhang@nju.edu.cn

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Issue

Vol. 114, Iss. 21 — 29 May 2015

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