Curvature-Controlled Defect Localization in Elastic Surface Crystals

Francisco López Jiménez, Norbert Stoop, Romain Lagrange, Jörn Dunkel, and Pedro M. Reis
Phys. Rev. Lett. 116, 104301 – Published 7 March 2016
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Abstract

We investigate the influence of curvature and topology on crystalline dimpled patterns on the surface of generic elastic bilayers. Our numerical analysis predicts that the total number of defects created by adiabatic compression exhibits universal quadratic scaling for spherical, ellipsoidal, and toroidal surfaces over a wide range of system sizes. However, both the localization of individual defects and the orientation of defect chains depend strongly on the local Gaussian curvature and its gradients across a surface. Our results imply that curvature and topology can be utilized to pattern defects in elastic materials, thus promising improved control over hierarchical bending, buckling, or folding processes. Generally, this study suggests that bilayer systems provide an inexpensive yet valuable experimental test bed for exploring the effects of geometrically induced forces on assemblies of topological charges.

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  • Received 20 September 2015

DOI:https://doi.org/10.1103/PhysRevLett.116.104301

© 2016 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Francisco López Jiménez1, Norbert Stoop2, Romain Lagrange2, Jörn Dunkel2,*, and Pedro M. Reis1,3,†

  • 1Department of Civil & Environmental Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139-4307, USA
  • 2Department of Mathematics, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139-4307, USA
  • 3Department of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139-4307, USA

  • *Corresponding author. dunkel@mit.edu
  • Corresponding author. preis@mit.edu

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Issue

Vol. 116, Iss. 10 — 11 March 2016

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