Polarization-Driven Topological Insulator Transition in a GaN/InN/GaN Quantum Well

M. S. Miao, Q. Yan, C. G. Van de Walle, W. K. Lou, L. L. Li, and K. Chang
Phys. Rev. Lett. 109, 186803 – Published 2 November 2012
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Abstract

Topological insulator (TI) states have been demonstrated in materials with a narrow gap and large spin-orbit interactions (SOI). Here we demonstrate that nanoscale engineering can also give rise to a TI state, even in conventional semiconductors with a sizable gap and small SOI. Based on advanced first-principles calculations combined with an effective low-energy k·p Hamiltonian, we show that the intrinsic polarization of materials can be utilized to simultaneously reduce the energy gap and enhance the SOI, driving the system to a TI state. The proposed system consists of ultrathin InN layers embedded into GaN, a layer structure that is experimentally achievable.

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  • Received 8 May 2012

DOI:https://doi.org/10.1103/PhysRevLett.109.186803

© 2012 American Physical Society

Authors & Affiliations

M. S. Miao1,3,*, Q. Yan1, C. G. Van de Walle1, W. K. Lou2, L. L. Li2, and K. Chang2,3,†

  • 1Materials Research Laboratory and Materials Department, University of California, Santa Barbara, California 93106-5050, USA
  • 2SKLSM, Institute of Semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, People’s Republic of China
  • 3Beijing Computational Science Research Center, Beijing 10084, People’s Republic of China

  • *miaoms@engineering.ucsb.edu
  • kchang@semi.ac.cn

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Vol. 109, Iss. 18 — 2 November 2012

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