Probing the Topological Exciton Condensate via Coulomb Drag

M. P. Mink, H. T. C. Stoof, R. A. Duine, Marco Polini, and G. Vignale
Phys. Rev. Lett. 108, 186402 – Published 1 May 2012
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Abstract

The onset of exciton condensation in a topological insulator thin film was recently predicted. We calculate the critical temperature for this transition, taking into account screening effects. Furthermore, we show that the proximity to this transition can be probed by measuring the Coulomb drag resistivity between the surfaces of the thin film as a function of temperature. This resistivity shows an upturn upon approaching the exciton-condensed state.

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  • Received 17 August 2011

DOI:https://doi.org/10.1103/PhysRevLett.108.186402

© 2012 American Physical Society

Authors & Affiliations

M. P. Mink*, H. T. C. Stoof, and R. A. Duine

  • Institute for Theoretical Physics, Utrecht University, Leuvenlaan 4, 3584 CE Utrecht, The Netherlands

Marco Polini

  • NEST, Istituto Nanoscienze-CNR and Scuola Normale Superiore, I-56126 Pisa, Italy

G. Vignale

  • Department of Physics and Astronomy, University of Missouri, Columbia, Missouri 65211, USA

  • *m.p.mink@uu.nl

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Issue

Vol. 108, Iss. 18 — 4 May 2012

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