Quantum Quench of an Atomic Mott Insulator

David Chen, Matthew White, Cecilia Borries, and Brian DeMarco
Phys. Rev. Lett. 106, 235304 – Published 10 June 2011

Abstract

We study quenches across the Bose-Hubbard Mott-insulator-to-superfluid quantum phase transition by using an ultracold atomic gas trapped in an optical lattice. Quenching from the Mott insulator to the superfluid phase is accomplished by continuously tuning the ratio of Hubbard tunneling to interaction energy. Excitations of the condensate formed after the quench are measured by using time-of-flight imaging. We observe that the degree of excitation is proportional to the fraction of atoms that cross the phase boundary and that the quantity of excitations and energy produced during the quench have a power-law dependence on the quench rate. These phenomena suggest an excitation process analogous to the Kibble-Zurek mechanism for defect generation in nonequilibrium classical phase transitions.

  • Figure
  • Figure
  • Figure
  • Received 4 April 2011

DOI:https://doi.org/10.1103/PhysRevLett.106.235304

© 2011 American Physical Society

Authors & Affiliations

David Chen, Matthew White*, Cecilia Borries, and Brian DeMarco

  • Department of Physics, University of Illinois, 1110 West Green Street, Urbana, Illinois 61801, USA

  • *Present address: Stanford Research Systems Inc., 1290-D Reamwood Avenue, Sunnyvale, CA 94089, USA.
  • Present address: Department of Atmospheric Sciences, University of Alaska, 930 Koyukuk Drive, Fairbanks, AK 99775, USA.

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 106, Iss. 23 — 10 June 2011

Reuse & Permissions
Access Options
CHORUS

Article Available via CHORUS

Download Accepted Manuscript
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×