Wetting and spreading

Daniel Bonn, Jens Eggers, Joseph Indekeu, Jacques Meunier, and Etienne Rolley
Rev. Mod. Phys. 81, 739 – Published 27 May 2009

Abstract

Wetting phenomena are ubiquitous in nature and technology. A solid substrate exposed to the environment is almost invariably covered by a layer of fluid material. In this review, the surface forces that lead to wetting are considered, and the equilibrium surface coverage of a substrate in contact with a drop of liquid. Depending on the nature of the surface forces involved, different scenarios for wetting phase transitions are possible; recent progress allows us to relate the critical exponents directly to the nature of the surface forces which lead to the different wetting scenarios. Thermal fluctuation effects, which can be greatly enhanced for wetting of geometrically or chemically structured substrates, and are much stronger in colloidal suspensions, modify the adsorption singularities. Macroscopic descriptions and microscopic theories have been developed to understand and predict wetting behavior relevant to microfluidics and nanofluidics applications. Then the dynamics of wetting is examined. A drop, placed on a substrate which it wets, spreads out to form a film. Conversely, a nonwetted substrate previously covered by a film dewets upon an appropriate change of system parameters. The hydrodynamics of both wetting and dewetting is influenced by the presence of the three-phase contact line separating “wet” regions from those that are either dry or covered by a microscopic film only. Recent theoretical, experimental, and numerical progress in the description of moving contact line dynamics are reviewed, and its relation to the thermodynamics of wetting is explored. In addition, recent progress on rough surfaces is surveyed. The anchoring of contact lines and contact angle hysteresis are explored resulting from surface inhomogeneities. Further, new ways to mold wetting characteristics according to technological constraints are discussed, for example, the use of patterned surfaces, surfactants, or complex fluids.

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    DOI:https://doi.org/10.1103/RevModPhys.81.739

    ©2009 American Physical Society

    Authors & Affiliations

    Daniel Bonn

    • Laboratoire de Physique Statistique, Ecole Normale Supérieure, 24 rue Lhomond, 75005 Paris, France and van der Waals-Zeeman Institute, University of Amsterdam, Valckenierstraat 65, 1018 XE, Amsterdam, The Netherlands

    Jens Eggers

    • School of Mathematics, University of Bristol, University Walk, Bristol BS8 1TW, United Kingdom

    Joseph Indekeu

    • Instituut voor Theoretische Fysica, Katholieke Universiteit Leuven, 3001 Leuven, Belgium

    Jacques Meunier and Etienne Rolley

    • Laboratoire de Physique Statistique, Ecole Normale Supérieure, 24 rue Lhomond, 75005 Paris, France

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    Issue

    Vol. 81, Iss. 2 — April - June 2009

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