• Open Access

Improved accuracy fullerene polarizability measurements in a long-baseline matter-wave interferometer

Yaakov Y. Fein, Philipp Geyer, Filip Kiałka, Stefan Gerlich, and Markus Arndt
Phys. Rev. Research 1, 033158 – Published 9 December 2019

Abstract

We present electric deflection results for the fullerenes C60 and C70 obtained with a long-baseline matter-wave interferometer. The second grating of the interferometer is interchangeable between a material grating for fast atom beams and an optical phase grating for polarizable molecules. This allows us to use cesium as a calibration particle and thus measure molecular susceptibilities with improved systematic uncertainty. The static polarizabilities of C60 and C70 are measured as 4πɛ0×87.4±0.4±2.5Å3 and 4πɛ0×106.4±0.2±1.1Å3, respectively, in excellent agreement with previous deflection experiments, but with improved uncertainties.

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  • Received 12 September 2019

DOI:https://doi.org/10.1103/PhysRevResearch.1.033158

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Atomic, Molecular & Optical

Authors & Affiliations

Yaakov Y. Fein, Philipp Geyer, Filip Kiałka, Stefan Gerlich, and Markus Arndt*

  • Faculty of Physics, University of Vienna, Boltzmanngasse 5, A-1090 Vienna, Austria

  • *markus.arndt@univie.ac.at

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Issue

Vol. 1, Iss. 3 — December - December 2019

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