Surface and bulk ferroelectric phase transition in super-tetragonal BiFeO3 thin films

Myriam Lachheb, Qiuxiang Zhu, Stéphane Fusil, Qiang Wu, Cécile Carrétéro, Aymeric Vecchiola, Manuel Bibes, Dominique Martinotti, Claire Mathieu, Christophe Lubin, Alexandre Pancotti, Xiaoyan Li-Bourrelier, Alexandre Gloter, Brahim Dkhil, Vincent Garcia, and Nick Barrett
Phys. Rev. Materials 5, 024410 – Published 23 February 2021

Abstract

The temperature-dependent ferroelectric properties of super-tetragonal BiFeO3 are investigated using surface-sensitive low-energy electron microscopy (LEEM). We use epitaxial oxide BiFeO3/Ca0.96Ce0.04MnO3 bilayers grown by pulsed laser deposition on YAlO3 substrates. Ferroelectric, micrometer-scale domains are written by piezoresponse force microscopy and subsequently observed by LEEM from room temperature up to about 950 K. Kelvin probe force microscopy and LEEM spectroscopy reveal that the surface potential is efficiently (>50%) screened by adsorbates that are only released after annealing above 873 ± 50 K in ultrahigh vacuum. The surface structure and chemistry of the ferroelectric thin films are analyzed using scanning transmission electron microscopy, electron energy loss spectroscopy, and x-ray photoelectron spectroscopy, discarding the occurrence of a putative “skin layer” effect. While its magnetic and structural transitions were reported in the literature, the true, ferroelectric Curie temperature of super-tetragonal BiFeO3 has not been determined so far. Here, we measure a Curie temperature of 930 ± 30 K for the super-tetragonal BiFeO3 surface and corroborate it with volume-sensitive, temperature-dependent x-ray diffraction measurements. These results suggest that LEEM can be used as a powerful tool to probe surface charge and ferroelectric transitions in ultrathin films.

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  • Received 2 November 2020
  • Revised 20 January 2021
  • Accepted 4 February 2021

DOI:https://doi.org/10.1103/PhysRevMaterials.5.024410

©2021 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Myriam Lachheb1, Qiuxiang Zhu2, Stéphane Fusil2,3,*, Qiang Wu1,†, Cécile Carrétéro2, Aymeric Vecchiola2, Manuel Bibes2, Dominique Martinotti1, Claire Mathieu1, Christophe Lubin1, Alexandre Pancotti4, Xiaoyan Li-Bourrelier5, Alexandre Gloter5, Brahim Dkhil6, Vincent Garcia2, and Nick Barrett1,‡

  • 1SPEC, CEA, CNRS, Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette, France
  • 2Unité Mixte de Physique, CNRS, Thales, Université Paris-Saclay, 91767 Palaiseau, France
  • 3Université d'Evry, Université Paris-Saclay, 91000 Evry, France
  • 4Federal University of Goias, Unidade Academica Especial de Ciencias Exactas e Tecnologicas, Campus Jatoba - Ciudade Universitaria, BR 364 km 195 3800, 75801-615, Jatai-GO, Brazil
  • 5Laboratoire de Physique des Solides, CNRS, Université Paris-Saclay, 91405 Orsay, France
  • 6Laboratoire Structures, Propriétés et Modélisation des Solides, CentraleSupélec, CNRS-UMR8580, Université Paris-Saclay, 91190 Gif-sur-Yvette, France

  • *Corresponding author: Stephane.fusil@cnrs-thales.fr
  • Present address: Department of Earth Sciences, The University of Hong Kong, Hong Kong.
  • Corresponding author: nick.barrett@cea.fr

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Vol. 5, Iss. 2 — February 2021

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