Carrier localization in quaternary Ga1xMnxAs1yPy ferromagnetic semiconductor films

Sining Dong, Logan Riney, Xinyu Liu, Lei Guo, Ren-Kui Zheng, Xiang Li, Seul-Ki Bac, Jacek Kossut, Margaret Dobrowolska, Badih Assaf, and Jacek K. Furdyna
Phys. Rev. Materials 5, 014402 – Published 7 January 2021
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Abstract

Motivated by the fact that holes in the Ga1xMnxAs family of ferromagnetic semiconductors play a key role in determining their ferromagnetic properties, we have measured hole concentrations in a series of three Ga1xMnxAs1yPy alloys grown by molecular beam epitaxy with varying amounts of phosphorus. This was carried out by Hall effect measurements, after eliminating the effect of the anomalous Hall term, and thus isolating the ordinary Hall term that directly provides the concentration of freely moving holes. Comparing these Hall effect results with total hole concentrations obtained from the number of acceptors and compensating donors as given by structural and magnetization measurements, we find that the number of itinerant holes (i.e., holes that contribute to the Hall effect) is significantly less than the total hole concentration. This indicates that a considerable fraction of the holes arising from Mn acceptors are localized. We find, furthermore, that the degree of such localization increases with the concentration of phosphorus in the Ga1xMnxAs1yPy alloy. Our results indicate that the Curie temperature (and, by extension, other magnetic properties) described by the Zener model in ferromagnetic semiconductors of the Ga1xMnxAs family are determined by the itinerant holes rather than by the total hole concentration. Finally, our results also indicate that ferromagnetism in these alloys vanishes when the total hole concentration falls below a certain Mott-like threshold, suggesting that the holes (both localized and itinerant) reside in the acceptor impurity band created by the presence of Mn acceptors.

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  • Received 4 August 2020
  • Accepted 18 December 2020

DOI:https://doi.org/10.1103/PhysRevMaterials.5.014402

©2021 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Sining Dong1,2, Logan Riney1, Xinyu Liu1,*, Lei Guo3, Ren-Kui Zheng3,4, Xiang Li1, Seul-Ki Bac1,5, Jacek Kossut6, Margaret Dobrowolska1, Badih Assaf1, and Jacek K. Furdyna1

  • 1Department of Physics, University of Notre Dame, Notre Dame, Indiana 46556, USA
  • 2Research Institute of Superconductor Electronics, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, China
  • 3Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China
  • 4School of Materials Science and Engineering, Jiangxi Engineering Laboratory for Advanced Functional Thin Films, Nanchang University, Nanchang 330031, China
  • 5Department of Physics, Korea University, Seoul 136-701, Korea
  • 6Institute of Physics, Polish Academy of Sciences, 02-668 Warszawa, Poland

  • *Corresponding author: xliu2@nd.edu

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Issue

Vol. 5, Iss. 1 — January 2021

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