Abstract
The effects of hydrogen incorporation into thin films have been investigated by chemical, electrical, and optical characterization techniques. Hydrogen incorporation was achieved by remote plasma doping without any structural alterations of the film; however, x-ray photoemission reveals major changes in the oxygen chemical environment. Depth-resolved cathodoluminescence (CL) reveals that the near-surface region of the H-doped film exhibits a distinct red luminescence (RL) band at 1.9 eV. The emergence of the H-related RL band is accompanied by an enhancement in the electrical conductivity of the film by an order of magnitude. Temperature-resolved CL points to the formation of abundant H-related donors with a binding energy of . The RL emission is attributed to shallow donor-deep acceptor pair recombination, where the acceptor is a -H complex and the shallow donor is interstitial H. The binding energy of the -H complex, based on our experimental considerations, is consistent with the computational results by Varley et al., [J. Phys.: Condens. Matter 23, 334212 (2011)].
- Received 16 May 2020
- Accepted 14 July 2020
DOI:https://doi.org/10.1103/PhysRevMaterials.4.085201
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