Photon Statistics of Semiconductor Microcavity Lasers

S. M. Ulrich, C. Gies, S. Ates, J. Wiersig, S. Reitzenstein, C. Hofmann, A. Löffler, A. Forchel, F. Jahnke, and P. Michler
Phys. Rev. Lett. 98, 043906 – Published 25 January 2007

Abstract

We present measurements of first- and second-order coherence of quantum-dot micropillar lasers together with a semiconductor laser theory. Our results show a broad threshold region for the observed high-β microcavities. The intensity jump is accompanied by both pronounced photon intensity fluctuations and strong coherence length changes. The investigations clearly visualize a smooth transition from spontaneous to predominantly stimulated emission which becomes harder to determine for high β. In our theory, a microscopic approach is used to incorporate the semiconductor nature of quantum dots. The results are in agreement with the experimental intensity traces and the photon statistics measurements.

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  • Received 2 March 2006

DOI:https://doi.org/10.1103/PhysRevLett.98.043906

©2007 American Physical Society

Authors & Affiliations

S. M. Ulrich1,*, C. Gies2, S. Ates1, J. Wiersig2, S. Reitzenstein3, C. Hofmann3, A. Löffler3, A. Forchel3, F. Jahnke2, and P. Michler1

  • 1Institut für Strahlenphysik, Universität Stuttgart, Germany
  • 2Institut für Theoretische Physik, Universität Bremen, Germany
  • 3Lehrstuhl für Technische Physik, Universität Würzburg, Germany

  • *Corresponding author. Electronic address: s.ulrich@physik.uni-stuttgart.de

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Vol. 98, Iss. 4 — 26 January 2007

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