Twin Boundaries Can Be Moved by Step Edges During Film Growth

W. L. Ling, N. C. Bartelt, K. F. McCarty, and C. B. Carter
Phys. Rev. Lett. 95, 166105 – Published 13 October 2005

Abstract

We track individual twin boundaries in Ag films on Ru(0001) using low-energy electron microscopy. The twin boundaries, which separate film regions whose close-packed planes are stacked differently, move readily during film growth but relatively little during annealing. The growth-driven motion of twin boundaries occurs as film steps advance across the surface—as a new atomic Ag layer reaches an fcc twin boundary, the advancing step edge carries along the boundary. This coupling of the microstructural defect (twin boundary) and the surface step during growth can produce film regions over 10μm wide that are twin free.

  • Figure
  • Figure
  • Figure
  • Figure
  • Received 20 May 2005

DOI:https://doi.org/10.1103/PhysRevLett.95.166105

©2005 American Physical Society

Authors & Affiliations

W. L. Ling, N. C. Bartelt, and K. F. McCarty

  • Sandia National Laboratories, Livermore, California 94550, USA

C. B. Carter

  • University of Minnesota, Minneapolis, Minnesota 55455, USA

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 95, Iss. 16 — 14 October 2005

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×