Quantitative Image Reconstruction of GaN Quantum Dots from Oversampled Diffraction Intensities Alone

Jianwei Miao, Yoshinori Nishino, Yoshiki Kohmura, Bart Johnson, Changyong Song, Subhash H. Risbud, and Tetsuya Ishikawa
Phys. Rev. Lett. 95, 085503 – Published 17 August 2005

Abstract

The missing data problem, i.e., the intensities at the center of diffraction patterns cannot be experimentally measured, is currently a major limitation for wider applications of coherent diffraction microscopy. We report here that, when the missing data are confined within the centrospeckle, the missing data problem can be reliably solved. With an improved instrument, we recorded 27 oversampled diffraction patterns at various orientations from a GaN quantum dot nanoparticle and performed quantitative image reconstruction from the diffraction intensities alone. This work in principle clears the way for single-shot imaging experiments using x-ray free electron lasers.

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  • Received 8 March 2005

DOI:https://doi.org/10.1103/PhysRevLett.95.085503

©2005 American Physical Society

Authors & Affiliations

Jianwei Miao1, Yoshinori Nishino2, Yoshiki Kohmura2, Bart Johnson3, Changyong Song1, Subhash H. Risbud4, and Tetsuya Ishikawa2

  • 1Department of Physics and Astronomy and CNSI, University of California, Los Angeles, California 90095-1547, USA
  • 2SPring-8/RIKEN, 1-1-1, Kouto, Mikazuki, Sayo-gun, Hyogo 679-5198, Japan
  • 3Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, Menlo Park, California 94025, USA
  • 4Department of Chemical Engineering and Materials Science, University of California, Davis, California 95616, USA

See Also

Phase Measurement for Accurate Mapping of Chemical Bonds in Acentric Space Groups

M. A. Spackman, B. Jiang, T. L. Groy, H. He, A. E. Whitten, and J. C. H. Spence
Phys. Rev. Lett. 95, 085502 (2005)

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Vol. 95, Iss. 8 — 19 August 2005

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