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Tip-Enhanced Fluorescence Microscopy at 10 Nanometer Resolution

Jordan M. Gerton, Lawrence A. Wade, Guillaume A. Lessard, Z. Ma, and Stephen R. Quake
Phys. Rev. Lett. 93, 180801 – Published 28 October 2004
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Abstract

We demonstrate unambiguously that the field enhancement near the apex of a laser-illuminated silicon tip decays according to a power law that is moderated by a single parameter characterizing the tip sharpness. Oscillating the probe in intermittent contact with a semiconductor nanocrystal strongly modulates the fluorescence excitation rate, providing robust optical contrast and enabling excellent background rejection. Laterally encoded demodulation yields images with <10nm spatial resolution, consistent with independent measurements of tip sharpness.

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  • Received 12 December 2003

DOI:https://doi.org/10.1103/PhysRevLett.93.180801

©2004 American Physical Society

Authors & Affiliations

Jordan M. Gerton*, Lawrence A. Wade, Guillaume A. Lessard, Z. Ma, and Stephen R. Quake

  • Department of Applied Physics, California Institute of Technology, MC 128-95, Pasadena, California 91125, USA

  • *Permanent address: University of UT, Department of Physics, 115 South 1400 East, Salt Lake City, UT 84112.

See Also

Tips for Better Fluorescence

JR Minkel
Phys. Rev. Focus 14, 19 (2004)

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Issue

Vol. 93, Iss. 18 — 29 October 2004

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