Abstract
We demonstrate unambiguously that the field enhancement near the apex of a laser-illuminated silicon tip decays according to a power law that is moderated by a single parameter characterizing the tip sharpness. Oscillating the probe in intermittent contact with a semiconductor nanocrystal strongly modulates the fluorescence excitation rate, providing robust optical contrast and enabling excellent background rejection. Laterally encoded demodulation yields images with spatial resolution, consistent with independent measurements of tip sharpness.
- Received 12 December 2003
DOI:https://doi.org/10.1103/PhysRevLett.93.180801
©2004 American Physical Society