Local Plasticity of Al Thin Films as Revealed by X-Ray Microdiffraction

R. Spolenak, W. L. Brown, N. Tamura, A. A. MacDowell, R. S. Celestre, H. A. Padmore, B. Valek, J. C. Bravman, T. Marieb, H. Fujimoto, B. W. Batterman, and J. R. Patel
Phys. Rev. Lett. 90, 096102 – Published 4 March 2003

Abstract

Grain-to-grain interactions dominate the plasticity of Al thin films and establish effective length scales smaller than the grain size. We have measured large strain distributions and their changes under plastic strain in 1.5μm-thick Al 0.5% Cu films using a 0.8μmdiameter white x-ray probe at the Advanced Light Source. Strain distributions arise not only from the distribution of grain sizes and orientation, but also from the differences in grain shape and from stress environment. Multiple active glide plane domains have been found within single grains. Large grains behave like multiple smaller grains even before a dislocation substructure can evolve.

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  • Received 12 January 2002

DOI:https://doi.org/10.1103/PhysRevLett.90.096102

©2003 American Physical Society

Authors & Affiliations

R. Spolenak* and W. L. Brown

  • Agere Systems, Lucent Technologies, Murray Hill, New Jersey 07974

N. Tamura, A. A. MacDowell, R. S. Celestre, and H. A. Padmore

  • Advanced Light Source, Berkeley, California 94720

B. Valek and J. C. Bravman

  • Department of Materials Science & Engineering, Stanford University, Stanford, California 94305

T. Marieb and H. Fujimoto

  • Intel Corporation, Santa Clara, California 95052 & Portland, Oregon 97124

B. W. Batterman and J. R. Patel

  • Advanced Light Source, Berkeley, California 94720, and Stanford Synchrotron Radiation Laboratories, Stanford, California 94309

  • *Present address: Max-Planck-Institute for Metals Research, Stuttgart, Germany. Electronic address: spolenak@mf.mpg.de

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Issue

Vol. 90, Iss. 9 — 7 March 2003

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