Abstract
MeV and ions were used to induce desorption from LiF. The contributions due to elastic atomic collisions and electronic excitation processes to the sputtering yield could be unambiguously separated. In the case of ions, a yield enhancement, i.e., , was found only for the electronic process. The maximum sputtering yield was observed in a projectile velocity range where the projectile electronic energy loss still increases. These results are simultaneously explained using the radial distribution of the deposited energy rather than the electronic energy loss.
- Received 30 August 1999
DOI:https://doi.org/10.1103/PhysRevLett.84.5904
©2000 American Physical Society