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Vacancy-Assisted Halogen Reactions on Si(100)- (2×1)

Koji Nakayama, C. M. Aldao, and J. H. Weaver
Phys. Rev. Lett. 82, 568 – Published 18 January 1999
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Abstract

Scanning tunneling microscopy studies of etching of Si(100)(2×1) show that the rate of terrace pit formation goes through a maximum for surface coverages of θ(Cl)=0.77±0.05monolayer, in contrast to predictions of conventional models. Using recently calculated energies for different possible surface configurations, we show that a key component in desorption is the formation of a single-atom vacancy adjacent to a volatile SiCl2 unit. The demonstration of vacancy-assisted reaction establishes a self-limited reaction and the sequence of events leading to desorption.

  • Received 20 July 1998

DOI:https://doi.org/10.1103/PhysRevLett.82.568

©1999 American Physical Society

Authors & Affiliations

Koji Nakayama1, C. M. Aldao2, and J. H. Weaver1

  • 1Department of Materials Science and Chemical Engineering, University of Minnesota, Minneapolis, Minnesota 55455
  • 2Institute of Materials Science and Technology, Universidad Nacional de Mar del Plata-CONICET, Juan B. Justo 4302, 7600 Mar del Plata, Argentina

See Also

A New Theory of Etching

Arthur Robinson
Phys. Rev. Focus 3, 4 (1999)

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Vol. 82, Iss. 3 — 18 January 1999

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