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Imaging Buried Interfacial Lattices with Quantized Electrons

I. B. Altfeder, D. M. Chen, and K. A. Matveev
Phys. Rev. Lett. 80, 4895 – Published 1 June 1998
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Abstract

We demonstrate that the well-known Si(111)(7×7) superlattice buried under as much as 100 Å of crystalline Pb can be directly imaged with a scanning tunneling microscope at 77 K. The unexpected transparency of the metal and the high lateral resolution are the result of a nondiffractive scattering of the electrons at the interface. We attribute this phenomenon to a large anisotropy of the effective masses associated with the free in-plane and the quantized transverse motion of the electrons.

  • Received 16 October 1997

DOI:https://doi.org/10.1103/PhysRevLett.80.4895

©1998 American Physical Society

Authors & Affiliations

I. B. Altfeder and D. M. Chen

  • The Rowland Institute for Science, Cambridge, Massachusetts 02142

K. A. Matveev

  • Department of Physics, Duke University, Durham, North Carolina 27708

See Also

Dowsing for Silicon

Phys. Rev. Focus 1, 17 (1998)

References (Subscription Required)

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Issue

Vol. 80, Iss. 22 — 1 June 1998

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