Real-Time Microscopy of Two-Dimensional Critical Fluctuations: Disordering of the Si(113)-( 3×1) Reconstruction

R. M. Tromp, W. Theis, and N. C. Bartelt
Phys. Rev. Lett. 77, 2522 – Published 16 September 1996
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Abstract

Using low-energy electron microscopy, we have studied the critical fluctuations associated with the disordering of the (3×1) reconstruction on Si(113). We not only observe and quantify the increased spatial correlations near Tc, but also the associated slowing down of the relaxation of long wavelength critical fluctuations. The dependence of the slowing down on correlation length is consistent with theories for phase transitions with nonconserved order parameters. In addition, we show that steps limit the size of the correlation length, as is often conjectured.

  • Received 18 April 1996

DOI:https://doi.org/10.1103/PhysRevLett.77.2522

©1996 American Physical Society

Authors & Affiliations

R. M. Tromp1, W. Theis1, and N. C. Bartelt2

  • 1IBM Research Division, T. J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598
  • 2Sandia National Laboratories, Livermore, California 94551

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Vol. 77, Iss. 12 — 16 September 1996

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