Si 2p Core-Level Shifts at the Si(001)-SiO2 Interface: A First-Principles Study

Alfredo Pasquarello, Mark S. Hybertsen, and Roberto Car
Phys. Rev. Lett. 74, 1024 – Published 6 February 1995
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Abstract

Using a first-principles approach, we calculate core-level shifts at the Si(001)-SiO2 interface. By fully relaxing interfaces between Si and tridymite, a crystalline form of SiO2, we obtain interface models with good local structural properties and with no electronic states in the Si gap. Calculated values of Si 2p core-level shifts agree well with data from photoemission experiments and show a linear dependence on the number of nearest-neighbor oxygen atoms. Core-hole relaxation accounts for ∼50% of the total shifts, in good agreement with Auger experiments.

  • Received 17 October 1994

DOI:https://doi.org/10.1103/PhysRevLett.74.1024

©1995 American Physical Society

Authors & Affiliations

Alfredo Pasquarello1,2, Mark S. Hybertsen2, and Roberto Car1,3

  • 1Institut Romand de Recherche Numérique en Physique des Matériaux (IRRMA), IN-Ecublens, CH-1015 Lausanne, Switzerland
  • 2AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey 07974
  • 3Department of Condensed Matter Physics, University of Geneva, CH-1211 Geneva, Switzerland

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Vol. 74, Iss. 6 — 6 February 1995

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