Anisotropic penetration depth in La2xSrxCuO4

T. Shibauchi, H. Kitano, K. Uchinokura, A. Maeda, T. Kimura, and K. Kishio
Phys. Rev. Lett. 72, 2263 – Published 4 April 1994
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Abstract

The surface impedance at 10 GHz was measured systematically in single-crystal La2xSrxCuO4 for carrier concentrations 0.09≤x≤0.19, from which penetration depth λ was determined. The anisotropy and the depencences on x and temperature T of λ are extensively studied for the first time. The anisotropy of λ(T=0) decreases with increasing x, and still remains larger than 10 for x=0.19. The out-of-plane penetration depth (λc) has a different temperature dependence from the in-plane one (λab). These results suggest that the electrodynamic properties in the superconducting state along the c axis can be explained by a Josephson-coupled layer model.

  • Received 3 March 1993

DOI:https://doi.org/10.1103/PhysRevLett.72.2263

©1994 American Physical Society

Authors & Affiliations

T. Shibauchi, H. Kitano, and K. Uchinokura

  • Department of Applied Physics, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113, Japan

A. Maeda

  • Department of Pure and Applied Sciences, The University of Tokyo, 3-8-1 Komaba, Meguro-ku, Tokyo 153, Japan

T. Kimura and K. Kishio

  • Department of Industrial Chemistry, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113, Japan

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Vol. 72, Iss. 14 — 4 April 1994

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