Origin of atomic resolution on metal surfaces in scanning tunneling microscopy

C. Julian Chen
Phys. Rev. Lett. 65, 448 – Published 23 July 1990
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Abstract

Scanning tunneling microscopy has repeatedly resolved individual atoms on a number of metal surfaces with atomic distances 2.5–3 Å. This is in sharp contradiction to the resolution limits previously predicted, 6–9 Å. We present a theory of such atomic resolution in terms of actual tip states, for example, dz2 tip states on tungsten tips. Quantitative interpretation of the observed images is obtained with no adjustable parameters. We predict that to achieve atomic resolution, the tip material should be either a d-band metal or certain semiconductor.

  • Received 7 November 1989

DOI:https://doi.org/10.1103/PhysRevLett.65.448

©1990 American Physical Society

Authors & Affiliations

C. Julian Chen

  • IBM Research Division, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598

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Issue

Vol. 65, Iss. 4 — 23 July 1990

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