Abstract
Using an atomic force microscope (AFM), we have studied the attractive and adhesive forces between a cantilever tip and sample surfaces as a function of sample surface energy. The measured forces systematically increased with surface energy. The AFM is very sensitive; changes in the surface forces (i.e., attraction and adhesion) of monolayer covered samples could be clearly discerned when only the surface group of the monolayer film was changed from - to -.
- Received 8 September 1989
DOI:https://doi.org/10.1103/PhysRevLett.64.1931
©1990 American Physical Society
Collections
This article appears in the following collection:
Scanning Probe Microscopy: From Sublime to Ubiquitous
This collection marks the 35th anniversary of scanning tunneling microscopy (STM) and the 30th anniversary of atomic force microscopy (AFM). These papers, all published in the Physical Review journals, highlight the positive impact that STM and AFM have had, and continue to have, on physical science research. The papers included in the collection have been made free to read.
