Diffusion and segregation in inhomogeneous media and the GexSi1x heterostructure

S. M. Hu
Phys. Rev. Lett. 63, 2492 – Published 27 November 1989; Erratum Phys. Rev. Lett. 67, 1475 (1991)
PDFExport Citation

Abstract

A theoretical groundwork has been laid for modeling dopant diffusion and distribution in semiconductor heterostructures. The driving force for the diffusion of a dopant is no longer simply given by its concentration gradient as in homogeneous semiconductors, but by the gradient of its chemical potential that derives from several contributions to the free energy of the solid solution, including two sources of strain energy and the variation of band gap with the composition of the heterostructure. Expressions for dopant flux and segregation are given.

  • Received 21 August 1989

DOI:https://doi.org/10.1103/PhysRevLett.63.2492

©1989 American Physical Society

Erratum

Authors & Affiliations

S. M. Hu

  • IBM General Technology Divison, East Fishkill Facility, Hopewell Junction, New York 12533

References (Subscription Required)

Click to Expand
Issue

Vol. 63, Iss. 22 — 27 November 1989

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×