Abstract
We present the first precise characterization of the profile of the precursor films which progressively develop ahead of the macroscopic edge of a spreading liquid drop. Experiments are performed on a model system (nonvolatile high-molecular-weight polydimethylsiloxane on smooth silicon wafers), using an ellipsometer with a high spatial resolution. Both the film profile and its evolution with time are in good qualitative agreement with recent models which include long-range force effects. Clear quantitative discrepancies may reveal specific polymeric effects.
- Received 30 October 1987
DOI:https://doi.org/10.1103/PhysRevLett.60.2390
©1988 American Physical Society
