Hot-Electron Spectroscopy of GaAs

J. R. Hayes, A. F. J. Levi, and W. Wiegmann
Phys. Rev. Lett. 54, 1570 – Published 8 April 1985
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Abstract

We report a new technique that enabled us to measure nonequilibrium carrier transport in GaAs. Hot electrons were injected into n+-GaAs with an excess energy of 0.25 eV above the conduction-band edge. The effect of scattering on the injected electrons was observed by use of a planar doped barrier as a "hot-electron spectrometer." The measured spectra indicated that significant scattering occurred and that mean free paths were on the order of a few hundred angstroms.

  • Received 17 January 1985

DOI:https://doi.org/10.1103/PhysRevLett.54.1570

©1985 American Physical Society

Authors & Affiliations

J. R. Hayes

  • Bell Communications Research, Murray Hill, New Jersey 07974

A. F. J. Levi and W. Wiegmann

  • AT&T Bell Laboratories, Murray Hill, New Jersey 07974

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Vol. 54, Iss. 14 — 8 April 1985

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