Differential Reflectivity of Si(111)2×1 Surface with Polarized Light: A Test for Surface Structure

P. Chiaradia; A. Cricenti; S. Selci; G. Chiarotti

doi:10.1103/PhysRevLett.52.1145

Differential Reflectivity of Si(111)2×1 Surface with Polarized Light: A Test for Surface Structure

P. Chiaradia, A. Cricenti, S. Selci, and G. Chiarotti

Phys. Rev. Lett. 52, 1145 – Published 26 March 1984

Abstract

The polarization dependence of the differential reflectivity of the Si(111)2×1 single-domain surface has been studied experimentally. A marked anisotropy of the optical peak at 0.45 eV associated with dangling bonds is observed with maximum absorption along $[0 \bar{1} 1]$ directions. The chain model is in good agreement with the experimental result.

Received 2 December 1983

DOI:https://doi.org/10.1103/PhysRevLett.52.1145

Authors & Affiliations

P. Chiaradia, A. Cricenti, and S. Selci

Dipartimento di Fisica, Università di Roma "La Sapienza," Roma, Italy, and Gruppo Nazionale di Struttura della Materia del Consiglio Nazionale delle Richerche, Roma, Italy

G. Chiarotti

Dipartimento di Fisica, II Università di Roma, Roma, Italy, and Istituto di Struttura della Materia del Consiglio Nazionale delle Richerche, Roma, Italy