Abstract
The yield strengths of thin-layered Al-Cu and Al-Ag laminates greatly increase as the layer thicknesses are reduced. This strength enhancement is interpreted as evidence for the retardation of dislocation generation and motion as has been theoretically proposed.
- Received 2 August 1978
DOI:https://doi.org/10.1103/PhysRevLett.41.1814
©1978 American Physical Society
