Abstract
The electric-field-induced change in the linear dielectric function for the and transitions of Ge, determined from low-field electroreflectance measurements, is shown to be in quantitative agreement with the third derivative of the linear dielectric function measured by high-resolution ellipsometry techniques. This result relates electroreflectance spectra to other types of modulation spectra and provides the first direct verification of the nonlinear optical interpretation of electroreflectance.
- Received 17 November 1971
DOI:https://doi.org/10.1103/PhysRevLett.28.168
©1972 American Physical Society