Charge-Noise-Induced Dephasing in Silicon Hole-Spin Qubits

Ognjen Malkoc, Peter Stano, and Daniel Loss
Phys. Rev. Lett. 129, 247701 – Published 8 December 2022
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Abstract

We investigate, theoretically, charge-noise-induced spin dephasing of a hole confined in a quasi-two-dimensional silicon quantum dot. Central to our treatment is accounting for higher-order corrections to the Luttinger Hamiltonian. Using experimentally reported parameters, we find that the new terms give rise to sweet spots for the hole-spin dephasing, which are sensitive to device details: dot size and asymmetry, growth direction, and applied magnetic and electric fields. Furthermore, we estimate that the dephasing time at the sweet spots is boosted by several orders of magnitude, up to on the order of milliseconds.

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  • Received 23 January 2022
  • Revised 27 September 2022
  • Accepted 9 November 2022

DOI:https://doi.org/10.1103/PhysRevLett.129.247701

© 2022 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Ognjen Malkoc1, Peter Stano1,2,*, and Daniel Loss1,3,4

  • 1RIKEN Center for Emergent Matter Science, Wako-shi, Saitama 351-0198, Japan
  • 2Institute of Physics, Slovak Academy of Sciences, 845 11 Bratislava, Slovakia
  • 3RIKEN Center for Quantum Computing, Wako, Saitama 351-0198, Japan
  • 4Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland

  • *Corresponding author. peter.stano@riken.jp

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Issue

Vol. 129, Iss. 24 — 9 December 2022

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