• Open Access

Ultrafast Demagnetization Dominates Fluence Dependence of Magnetic Scattering at Co M Edges

Michael Schneider, Bastian Pfau, Christian M. Günther, Clemens von Korff Schmising, David Weder, Jan Geilhufe, Jonathan Perron, Flavio Capotondi, Emanuele Pedersoli, Michele Manfredda, Martin Hennecke, Boris Vodungbo, Jan Lüning, and Stefan Eisebitt
Phys. Rev. Lett. 125, 127201 – Published 15 September 2020
PDFHTMLExport Citation

Abstract

We systematically study the fluence dependence of the resonant scattering cross-section from magnetic domains in Co/Pd-based multilayers. Samples are probed with single extreme ultraviolet (XUV) pulses of femtosecond duration tuned to the Co M3,2 absorption resonances using the FERMI@Elettra free-electron laser. We report quantitative data over 3 orders of magnitude in fluence, covering 16mJ/cm2/pulse to 10000mJ/cm2/pulse with pulse lengths of 70 fs and 120 fs. A progressive quenching of the diffraction cross-section with fluence is observed. Compression of the same pulse energy into a shorter pulse—implying an increased XUV peak electric field—results in a reduced quenching of the resonant diffraction at the Co M3,2 edge. We conclude that the quenching effect observed for resonant scattering involving the short-lived Co 3p core vacancies is noncoherent in nature. This finding is in contrast to previous reports investigating resonant scattering involving the longer-lived Co 2p states, where stimulated emission has been found to be important. A phenomenological model based on XUV-induced ultrafast demagnetization is able to reproduce our entire set of experimental data and is found to be consistent with independent magneto-optical measurements of the demagnetization dynamics on the same samples.

  • Figure
  • Figure
  • Figure
  • Received 13 August 2019
  • Revised 27 March 2020
  • Accepted 7 August 2020

DOI:https://doi.org/10.1103/PhysRevLett.125.127201

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Michael Schneider1, Bastian Pfau1, Christian M. Günther2,3, Clemens von Korff Schmising1, David Weder1, Jan Geilhufe1, Jonathan Perron4, Flavio Capotondi5, Emanuele Pedersoli5, Michele Manfredda5, Martin Hennecke1, Boris Vodungbo4, Jan Lüning6, and Stefan Eisebitt1,2

  • 1Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy, Max-Born-Straße 2A, 12489 Berlin, Germany
  • 2Technische Universität Berlin, Institut für Optik und Atomare Physik, Straße des 17. Juni 135, 10623 Berlin, Germany
  • 3Technische Universität Berlin, Zentraleinrichtung Elektronenmikroskopie (ZELMI), Straße des 17. Juni 135, 10623 Berlin, Germany
  • 4Sorbonne Université, CNRS, Laboratoire de Chimie Physique—Matière et Rayonnement, LCPMR, 75005 Paris, France
  • 5Elettra Sincrotrone Trieste S.C.p.A., Strada Statale 14, km 163.5, 34149 Basovizza, TS, Italy
  • 6Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, 14109 Berlin, Germany

Article Text

Click to Expand

Supplemental Material

Click to Expand

References

Click to Expand
Issue

Vol. 125, Iss. 12 — 18 September 2020

Reuse & Permissions
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Reuse & Permissions

It is not necessary to obtain permission to reuse this article or its components as it is available under the terms of the Creative Commons Attribution 4.0 International license. This license permits unrestricted use, distribution, and reproduction in any medium, provided attribution to the author(s) and the published article's title, journal citation, and DOI are maintained. Please note that some figures may have been included with permission from other third parties. It is your responsibility to obtain the proper permission from the rights holder directly for these figures.

×

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×