How a dc Electric Field Drives Mott Insulators Out of Equilibrium

P. Diener, E. Janod, B. Corraze, M. Querré, C. Adda, M. Guilloux-Viry, S. Cordier, A. Camjayi, M. Rozenberg, M. P. Besland, and L. Cario
Phys. Rev. Lett. 121, 016601 – Published 3 July 2018
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Abstract

Out of equilibrium phenomena are a major issue of modern physics. In particular, correlated materials such as Mott insulators experience fascinating long-lived exotic states under a strong electric field. Yet, the origin of their destabilization by the electric field is not elucidated. Here we present a comprehensive study of the electrical response of canonical Mott insulators GaM4Q8 (M=V, Nb, Ta, Mo; Q=S, Se) in the context of a microscopic theory of electrical breakdown where in-gap states allow for a description in terms of a two-temperature model. Our results show how the nonlinearities and the resistive transition originate from a massive creation of hot electrons under an electric field. These results give new insights for the control of the long-lived states reached under an electric field in these systems which has recently open the way to new functionalities used in neuromorphic applications.

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  • Received 7 March 2017

DOI:https://doi.org/10.1103/PhysRevLett.121.016601

© 2018 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

P. Diener1,*, E. Janod1, B. Corraze1, M. Querré1,2, C. Adda1, M. Guilloux-Viry2, S. Cordier2, A. Camjayi3, M. Rozenberg4, M. P. Besland1, and L. Cario1,†

  • 1Institut des Matériaux Jean Rouxel, Université de Nantes, CNRS, 2 rue de la Houssinière, BP32229, 44322 Nantes Cedex 3, France
  • 2Univ Rennes, CNRS, ISCR (Institut des Sciences chimiques de Rennes) UMR 6226, 35000 Rennes, France
  • 3Departamento de Física, FCEyN, Universidad de Buenos Aires and IFIBA, Pabellón I, Ciudad Universitaria, 1428 CABA, Argentina
  • 4Laboratoire de Physique des Solides, Université Paris Sud, 91405 Orsay Cedex, France

  • *Present address: Institute for Electronics Microelectronics and Nanotechnology (IEMN) CNRS, University of Lille BP60069, avenue Poincare, F-59652 cedex, Villeneuve d’Ascq, France.
  • Corresponding author. laurent.cario@cnrs-imn.fr

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Issue

Vol. 121, Iss. 1 — 6 July 2018

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