Atomic-Scale Measurement of Flexoelectric Polarization at SrTiO3 Dislocations

Peng Gao, Shuzhen Yang, Ryo Ishikawa, Ning Li, Bin Feng, Akihito Kumamoto, Naoya Shibata, Pu Yu, and Yuichi Ikuhara
Phys. Rev. Lett. 120, 267601 – Published 29 June 2018
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Abstract

Owing to the broken translational symmetry at dislocations, a strain gradient naturally exists around the dislocation cores and can significantly influence the electrical and mechanical properties. We use aberration corrected scanning transmission electron microscopy to directly measure the flexoelectric polarization (28μCcm2) at dislocation cores in SrTiO3. The polarization charges can interact with the nonstoichiometric dislocation cores and thus impact the electrical activities. Our findings can help us to understand the properties of dislocations in perovskite, providing new insights into the design of new devices via defect engineering such as bicrystal fabrication and thin film growth.

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  • Received 7 March 2018
  • Revised 6 May 2018

DOI:https://doi.org/10.1103/PhysRevLett.120.267601

© 2018 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Peng Gao1,2,3,4,*,‡, Shuzhen Yang5,‡, Ryo Ishikawa1, Ning Li2, Bin Feng1, Akihito Kumamoto1, Naoya Shibata1, Pu Yu4,5, and Yuichi Ikuhara1,6,7,†

  • 1Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan
  • 2International Center for Quantum Materials, School of Physics, Peking University, Beijing 100871, China
  • 3Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China
  • 4Collaborative Innovation Center of Quantum Matter, Beijing 100871, China
  • 5State Key Laboratory of Low Dimensional Quantum Physics and Department of Physics, Tshinghua University, Beijing 100084, China
  • 6Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya 456-8587, Japan
  • 7WPI Advanced Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan

  • *p-gao@pku.edu.cn
  • ikuhara@sigma.t.u-tokyo.ac.jp
  • These authors contributed equally to this work.

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Issue

Vol. 120, Iss. 26 — 29 June 2018

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