Effect of Charge Localization on the Effective Hyperfine Interaction in Organic Semiconducting Polymers

Rugang Geng, Ram C. Subedi, Hoang M. Luong, Minh T. Pham, Weichuan Huang, Xiaoguang Li, Kunlun Hong, Ming Shao, Kai Xiao, Lawrence A. Hornak, and Tho D. Nguyen
Phys. Rev. Lett. 120, 086602 – Published 22 February 2018
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Abstract

Hyperfine interaction (HFI), originating from the coupling between spins of charge carriers and nuclei, has been demonstrated to strongly influence the spin dynamics of localized charges in organic semiconductors. Nevertheless, the role of charge localization on the HFI strength in organic thin films has not yet been experimentally investigated. In this study, the statistical relation hypothesis that the effective HFI of holes in regioregular poly(3-hexylthiophene) (P3HT) is proportional to 1/N0.5 has been examined, where N is the number of the random nuclear spins within the envelope of the hole wave function. First, by studying magnetoconductance in hole-only devices made by isotope-labeled P3HT we verify that HFI is indeed the dominant spin interaction in P3HT. Second, assuming that holes delocalize fully over the P3HT polycrystalline domain, the strength of HFI is experimentally demonstrated to be proportional to 1/N0.52 in excellent agreement with the statistical relation. Third, the HFI of electrons in P3HT is about 3 times stronger than that of holes due to the stronger localization of the electrons. Finally, the effective HFI in organic light emitting diodes is found to be a superposition of effective electron and hole HFI. Such a statistical relation may be generally applied to other semiconducting polymers. This Letter may provide great benefits for organic optoelectronics, chemical reaction kinetics, and magnetoreception in biology.

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  • Received 1 September 2017
  • Revised 10 February 2018

DOI:https://doi.org/10.1103/PhysRevLett.120.086602

© 2018 American Physical Society

Physics Subject Headings (PhySH)

Polymers & Soft Matter

Authors & Affiliations

Rugang Geng1, Ram C. Subedi1, Hoang M. Luong1, Minh T. Pham1, Weichuan Huang2, Xiaoguang Li2, Kunlun Hong3, Ming Shao3, Kai Xiao3, Lawrence A. Hornak4, and Tho D. Nguyen1,*

  • 1Department of Physics and Astronomy, University of Georgia, Athens, Georgia 30602, USA
  • 2Hefei National Laboratory for Physical Sciences at the Microscale, Department of Physics, and Collaborative Innovation Center of Advanced Microstructures, University of Science and Technology of China, Hefei 230026, China
  • 3Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
  • 4College of Engineering, University of Georgia, Athens, Georgia 30602, USA

  • *ngtho@uga.edu

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Issue

Vol. 120, Iss. 8 — 23 February 2018

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