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Coulomb-Driven Relativistic Electron Beam Compression

Chao Lu, Tao Jiang, Shengguang Liu, Rui Wang, Lingrong Zhao, Pengfei Zhu, Dao Xiang, and Jie Zhang
Phys. Rev. Lett. 120, 044801 – Published 25 January 2018
Physics logo See Synopsis: A Clearer View of the Atomic World

Abstract

Coulomb interaction between charged particles is a well-known phenomenon in many areas of research. In general, the Coulomb repulsion force broadens the pulse width of an electron bunch and limits the temporal resolution of many scientific facilities such as ultrafast electron diffraction and x-ray free-electron lasers. Here we demonstrate a scheme that actually makes use of the Coulomb force to compress a relativistic electron beam. Furthermore, we show that the Coulomb-driven bunch compression process does not introduce additional timing jitter, which is in sharp contrast to the conventional radio-frequency buncher technique. Our work not only leads to enhanced temporal resolution in electron-beam-based ultrafast instruments that may provide new opportunities in probing material systems far from equilibrium, but also opens a promising direction for advanced beam manipulation through self-field interactions.

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  • Received 25 October 2017

DOI:https://doi.org/10.1103/PhysRevLett.120.044801

© 2018 American Physical Society

Physics Subject Headings (PhySH)

Accelerators & BeamsPlasma Physics

Synopsis

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A Clearer View of the Atomic World

Published 25 January 2018

A new technique uses electric repulsion to compress electron beams that probe molecular processes.

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Authors & Affiliations

Chao Lu1,2, Tao Jiang1,2, Shengguang Liu1,2, Rui Wang1,2, Lingrong Zhao1,2, Pengfei Zhu1,2, Dao Xiang1,2,3,*, and Jie Zhang1,2

  • 1Key Laboratory for Laser Plasmas (Ministry of Education), School of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240, China
  • 2Collaborative Innovation Center of IFSA (CICIFSA), Shanghai Jiao Tong University, Shanghai 200240, China
  • 3Tsung-Dao Lee Institute, Shanghai Jiao Tong University, Shanghai 200240, China

  • *dxiang@sjtu.edu.cn

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Issue

Vol. 120, Iss. 4 — 26 January 2018

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