Abstract
Nonlinear optical processes at soft x-ray wavelengths have remained largely unexplored due to the lack of available light sources with the requisite intensity and coherence. Here we report the observation of soft x-ray second harmonic generation near the carbon edge () in graphite thin films generated by high intensity, coherent soft x-ray pulses at the FERMI free electron laser. Our experimental results and accompanying first-principles theoretical analysis highlight the effect of resonant enhancement above the carbon edge and show the technique to be interfacially sensitive in a centrosymmetric sample with second harmonic intensity arising primarily from the first atomic layer at the open surface. This technique and the associated theoretical framework demonstrate the ability to selectively probe interfaces, including those that are buried, with elemental specificity, providing a new tool for a range of scientific problems.
- Received 11 October 2017
DOI:https://doi.org/10.1103/PhysRevLett.120.023901
© 2018 American Physical Society
Physics Subject Headings (PhySH)
Viewpoint
X-Ray Probe Targets Interfaces
Published 8 January 2018
A new spectroscopy technique employs x rays from a free electron laser to measure the properties of interfaces that may be hidden within a material.
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