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Fourier-Transform Ghost Imaging with Hard X Rays

Hong Yu, Ronghua Lu, Shensheng Han, Honglan Xie, Guohao Du, Tiqiao Xiao, and Daming Zhu
Phys. Rev. Lett. 117, 113901 – Published 7 September 2016
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Abstract

Knowledge gained through x-ray crystallography fostered structural determination of materials and greatly facilitated the development of modern science and technology in the past century. However, it is only applied to crystalline structures and cannot resolve noncrystalline materials. Here we demonstrate a novel lensless Fourier-transform ghost imaging method with pseudothermal hard x rays that extends x-ray crystallography to noncrystalline samples. By measuring the second-order intensity correlation function of the light, Fourier-transform diffraction pattern of a complex amplitude sample is achieved at the Fresnel region in our experiment and the amplitude and phase distributions of the sample in the spatial domain are retrieved successfully. For the first time, ghost imaging is experimentally realized with x rays. Since a highly coherent x-ray source is not required, the method can be implemented with laboratory x-ray sources and it also provides a potential solution for lensless diffraction imaging with fermions, such as neutrons and electrons where intensive coherent sources usually are not available.

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  • Received 13 May 2016

DOI:https://doi.org/10.1103/PhysRevLett.117.113901

© 2016 American Physical Society

Physics Subject Headings (PhySH)

Atomic, Molecular & Optical

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Ghost Imaging with X Rays

Published 7 September 2016

The technique of ghost imaging, which builds up images of objects by combining information from light collected at two detectors, has been demonstrated in the x-ray regime.

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Authors & Affiliations

Hong Yu1, Ronghua Lu1, Shensheng Han1,*, Honglan Xie2, Guohao Du2, Tiqiao Xiao2, and Daming Zhu3,4

  • 1Key Laboratory for Quantum Optics and Centre for Cold Atom Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • 3University of Science and Technology of China, Hefei 230026, China
  • 4University of Missouri-Kansas City, Kansas City, Missouri 64110, USA

  • *sshan@mail.shcnc.ac.cn

See Also

Experimental X-Ray Ghost Imaging

Daniele Pelliccia, Alexander Rack, Mario Scheel, Valentina Cantelli, and David M. Paganin
Phys. Rev. Lett. 117, 113902 (2016)

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Vol. 117, Iss. 11 — 9 September 2016

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