Defects at the Nanoscale Impact Contact Line Motion at all Scales

Hugo Perrin, Romain Lhermerout, Kristina Davitt, Etienne Rolley, and Bruno Andreotti
Phys. Rev. Lett. 116, 184502 – Published 2 May 2016
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Abstract

The contact angle of a liquid drop moving on a real solid surface depends on the speed and direction of motion of the three-phase contact line. Many experiments have demonstrated that pinning on surface defects, thermal activation and viscous dissipation impact contact line dynamics, but so far, efforts have failed to disentangle the role of each of these dissipation channels. Here, we propose a unifying multiscale approach that provides a single quantitative framework. We use this approach to successfully account for the dynamics measured in a classic dip-coating experiment performed over an unprecedentedly wide range of velocity. We show that the full contact line dynamics up to the liquid film entrainment threshold can be parametrized by the size, amplitude and density of nanometer-scale defects. This leads us to reinterpret the contact angle hysteresis as a dynamical crossover rather than a depinning transition.

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  • Received 15 November 2015

DOI:https://doi.org/10.1103/PhysRevLett.116.184502

© 2016 American Physical Society

Physics Subject Headings (PhySH)

Fluid Dynamics

Authors & Affiliations

Hugo Perrin1, Romain Lhermerout2, Kristina Davitt2, Etienne Rolley2, and Bruno Andreotti1

  • 1Physique et Mécanique des Milieux Hétérogènes, UMR 7636 ESPCI -CNRS, Université Paris-Diderot, 10 rue Vauquelin, 75005 Paris, France
  • 2Laboratoire de Physique Statistique, Ecole Normale Supérieure, UPMC Université Paris 06, Université Paris Diderot, CNRS, 24 rue Lhomond, 75005 Paris, France

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Issue

Vol. 116, Iss. 18 — 6 May 2016

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