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Achromatic Elemental Mapping Beyond the Nanoscale in the Transmission Electron Microscope

K. W. Urban, J. Mayer, J. R. Jinschek, M. J. Neish, N. R. Lugg, and L. J. Allen
Phys. Rev. Lett. 110, 185507 – Published 2 May 2013
Physics logo See Synopsis: Atoms Snap into Focus

Abstract

Newly developed achromatic electron optics allows the use of wide energy windows and makes feasible energy-filtered transmission electron microscopy (EFTEM) at atomic resolution. In this Letter we present EFTEM images formed using electrons that have undergone a silicon L2,3 core-shell energy loss, exhibiting a resolution in EFTEM of 1.35 Å. This permits elemental mapping beyond the nanoscale provided that quantum mechanical calculations from first principles are done in tandem with the experiment to understand the physical information encoded in the images.

  • Received 18 January 2013

DOI:https://doi.org/10.1103/PhysRevLett.110.185507

© 2013 American Physical Society

Synopsis

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Atoms Snap into Focus

Published 2 May 2013

Researchers unveil the first chemically sensitive transmission electron microscope with single-atom resolution.

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Authors & Affiliations

K. W. Urban*

  • Peter Grünberg Institute and Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons (ER-C), Research Centre Jülich, D-52425 Jülich, Germany

J. Mayer

  • Gemeinschaftslabor für Elektronenmikroskopie and ER-C, RWTH Aachen University, Ahornstrasse 55, D-52074 Aachen, Germany

J. R. Jinschek

  • FEI Company, Achtseweg Noord 5, 5651 GG Eindhoven, Netherlands

M. J. Neish, N. R. Lugg, and L. J. Allen

  • School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia

  • *k.urban@fz-juelich.de

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Issue

Vol. 110, Iss. 18 — 3 May 2013

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