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Full Electric Control of Exchange Bias

S. M. Wu, Shane A. Cybart, D. Yi, James M. Parker, R. Ramesh, and R. C. Dynes
Phys. Rev. Lett. 110, 067202 – Published 4 February 2013
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Abstract

We report the creation of a multiferroic field effect device with a BiFeO3 (BFO) (antiferromagnetic-ferroelectric) gate dielectric and a La0.7Sr0.3MnO3 (LSMO) (ferromagnetic) conducting channel that exhibits direct, bipolar electrical control of exchange bias. We show that exchange bias is reversibly switched between two stable states with opposite exchange bias polarities upon ferroelectric poling of the BFO. No field cooling, temperature cycling, or additional applied magnetic or electric field beyond the initial BFO polarization is needed for this bipolar modulation effect. Based on these results and the current understanding of exchange bias, we propose a model to explain the control of exchange bias. In this model the coupled antiferromagnetic-ferroelectric order in BFO along with the modulation of interfacial exchange interactions due to ionic displacement of Fe3+ in BFO relative to Mn3+/4+ in LSMO cause bipolar modulation.

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  • Received 31 August 2012

DOI:https://doi.org/10.1103/PhysRevLett.110.067202

© 2013 American Physical Society

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Controlling Magnetism with a Flip of a Switch

Published 4 February 2013

Nanoscale engineering of multiferroic thin films enables electric control of a device’s interface magnetism, thus offering a promising prospective for ultralow power spintronics.

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Authors & Affiliations

S. M. Wu1,2,*, Shane A. Cybart1,2, D. Yi2,3, James M. Parker1,2, R. Ramesh1,2,3, and R. C. Dynes1,2,4

  • 1Department of Physics, University of California, Berkeley, California 94720, USA
  • 2Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  • 3Department of Materials Science and Engineering, University of California, Berkeley, California 94720, USA
  • 4Department of Physics, University of California San Diego, La Jolla, California 92093, USA

  • *stephenw@berkeley.edu

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Issue

Vol. 110, Iss. 6 — 8 February 2013

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