Dielectric Profile of Interfacial Water and its Effect on Double-Layer Capacitance

Douwe Jan Bonthuis, Stephan Gekle, and Roland R. Netz
Phys. Rev. Lett. 107, 166102 – Published 13 October 2011
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Abstract

The framework for deriving tensorial interfacial dielectric profiles from bound charge distributions is established and applied to molecular dynamics simulations of water at hydrophobic and hydrophilic surfaces. In conjunction with a modified Poisson-Boltzmann equation, the trend of experimental double-layer capacitances is well reproduced. We show that the apparent Stern layer can be understood in terms of the dielectric profile of pure water.

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  • Received 5 April 2011

DOI:https://doi.org/10.1103/PhysRevLett.107.166102

© 2011 American Physical Society

Authors & Affiliations

Douwe Jan Bonthuis1, Stephan Gekle1, and Roland R. Netz2

  • 1Physik Department, Technische Universität München, 85748 Garching, Germany
  • 2Fachbereich Physik, Freie Universität, Berlin, 14195 Berlin, Germany

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Issue

Vol. 107, Iss. 16 — 14 October 2011

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