Abstract
A new microscopy technique is introduced, image scanning microscopy (ISM), which combines conventional confocal-laser scanning microscopy with fast wide-field CCD detection. The technique allows for doubling the lateral optical resolution in fluorescence imaging. The physical principle behind ISM is similar to structured illumination microscopy, by combining the resolving power of confocal-laser scanning microscopy with that of a wide-field imaging microscopy. This Letter describes the theoretical foundation and experimental realization of ISM.
- Received 28 October 2009
DOI:https://doi.org/10.1103/PhysRevLett.104.198101
©2010 American Physical Society
Viewpoint
Blurry vision belongs to history
Published 10 May 2010
Making simple modifications to laser-scanning microscopes—like those found in many laboratories—can beat the classical diffraction limit by a factor of .
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