Measurements of Surface Diffusivity and Coarsening during Pulsed Laser Deposition

J. D. Ferguson, G. Arikan, D. S. Dale, A. R. Woll, and J. D. Brock
Phys. Rev. Lett. 103, 256103 – Published 18 December 2009
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Abstract

Pulsed laser deposition (PLD) of homoepitaxial SrTiO3001 was studied with in situ x-ray specular reflectivity and surface diffuse x-ray scattering. Unlike prior reflecivity-based studies, these measurements access both time and length scales of the evolution of the surface morphology during growth. In particular, we show that this technique allows direct measurements of the diffusivity for both inter- and intralayer transport. Our results explicitly limit the possible role of island breakup, demonstrate the key roles played by nucleation and coarsening in PLD, and place an upper bound on the Ehrlich-Schwoebel barrier for downhill interlayer diffusion.

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  • Received 16 October 2009

DOI:https://doi.org/10.1103/PhysRevLett.103.256103

©2009 American Physical Society

Authors & Affiliations

J. D. Ferguson1,2, G. Arikan3,2, D. S. Dale4, A. R. Woll4, and J. D. Brock3,2

  • 1Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA
  • 2Cornell Center for Materials Research, Cornell University, Ithaca, New York 14853, USA
  • 3School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA
  • 4Cornell High Energy Synchrotron Source, Cornell University, Ithaca, New York 14853, USA

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Issue

Vol. 103, Iss. 25 — 18 December 2009

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