• Featured in Physics
  • Editors' Suggestion

Evidence for Two Time Scales in Long SNS Junctions

F. Chiodi, M. Aprili, and B. Reulet
Phys. Rev. Lett. 103, 177002 – Published 23 October 2009
Physics logo See Synopsis: Supercurrents in a junction—it’s all about the timing

Abstract

We use microwave excitation to elucidate the dynamics of long superconductor–normal metal–superconductor Josephson junctions. By varying the excitation frequency in the range 10 MHz–40 GHz, we observe that the critical and retrapping currents, deduced from the dc voltage versus dc current characteristics of the junction, are set by two different time scales. The critical current increases when the ac frequency is larger than the inverse diffusion time in the normal metal, whereas the retrapping current is strongly modified when the excitation frequency is above the electron-phonon rate in the normal metal. Therefore the critical and retrapping currents are associated with elastic and inelastic scattering, respectively.

  • Figure
  • Figure
  • Figure
  • Figure
  • Received 13 August 2009

DOI:https://doi.org/10.1103/PhysRevLett.103.177002

©2009 American Physical Society

Synopsis

Key Image

Supercurrents in a junction—it’s all about the timing

Published 26 October 2009

Microwave-frequency excitation of a superconductor-metal-superconductor junction is used to resolve the dynamic mechanisms behind the temporal response.

See more in Physics

Authors & Affiliations

F. Chiodi, M. Aprili, and B. Reulet

  • Laboratoire de Physique des Solides, UMR8502, Bâtiment 510, Université Paris-Sud, 91405 ORSAY Cedex, France

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 103, Iss. 17 — 23 October 2009

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×