Randomized Benchmarking and Process Tomography for Gate Errors in a Solid-State Qubit

J. M. Chow, J. M. Gambetta, L. Tornberg, Jens Koch, Lev S. Bishop, A. A. Houck, B. R. Johnson, L. Frunzio, S. M. Girvin, and R. J. Schoelkopf
Phys. Rev. Lett. 102, 090502 – Published 5 March 2009; Erratum Phys. Rev. Lett. 102, 119901 (2009)
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Abstract

We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double π pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1±0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.

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  • Received 26 November 2008
  • Corrected 11 March 2009

DOI:https://doi.org/10.1103/PhysRevLett.102.090502

©2009 American Physical Society

Corrections

11 March 2009

Erratum

Publisher’s Note: Randomized Benchmarking and Process Tomography for Gate Errors in a Solid-State Qubit [Phys. Rev. Lett. 102, 090502 (2009)]

J. M. Chow, J. M. Gambetta, L. Tornberg, Jens Koch, Lev S. Bishop, A. A. Houck, B. R. Johnson, L. Frunzio, S. M. Girvin, and R. J. Schoelkopf
Phys. Rev. Lett. 102, 119901 (2009)

Authors & Affiliations

J. M. Chow1, J. M. Gambetta2, L. Tornberg3, Jens Koch1, Lev S. Bishop1, A. A. Houck1, B. R. Johnson1, L. Frunzio1, S. M. Girvin1, and R. J. Schoelkopf1

  • 1Departments of Physics and Applied Physics, Yale University, New Haven, Connecticut 06520, USA
  • 2Institute for Quantum Computing and Department of Physics and Astronomy, University of Waterloo, Waterloo, Ontario, Canada N2L 3G1
  • 3Chalmers University of Technology, SE-41296 Gothenburg, Sweden

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Issue

Vol. 102, Iss. 9 — 6 March 2009

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