Abstract
We propose a method of measuring the electron temperature in mesoscopic conductors and demonstrate experimentally its applicability to micron-size graphene devices in the linear-response regime (, the bath temperature). The method can be especially useful in case of overheating, . It is based on analysis of the correlation function of mesoscopic conductance fluctuations. Although the fluctuation amplitude strongly depends on the details of electron scattering in graphene, we show that extracted from the correlation function is insensitive to these details.
- Received 26 August 2008
DOI:https://doi.org/10.1103/PhysRevLett.102.066801
©2009 American Physical Society