Hard X Ray Holographic Diffraction Imaging

Lorenz-M. Stadler, Christian Gutt, Tina Autenrieth, Olaf Leupold, Stefan Rehbein, Yuriy Chushkin, and Gerhard Grübel
Phys. Rev. Lett. 100, 245503 – Published 20 June 2008
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Abstract

We determine the absolute electron density of a lithographically grown nanostructure with 25 nm resolution by combining hard x-ray Fourier transform holography with iterative phase retrieval methods. While holography immediately reveals an unambiguous image of the object, we deploy in addition iterative phase retrieval algorithms for pushing the resolution close to the diffraction limit. The use of hard (8 keV) x rays eliminates practically all constraints on sample environment and enables a destruction-free investigation of relatively thick or buried samples, making holographic diffraction imaging a very attractive tool for materials science. We note that the technique is ideally suited for subpicosecond imaging that will become possible with the emerging hard x-ray free-electron lasers.

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  • Received 15 February 2008

DOI:https://doi.org/10.1103/PhysRevLett.100.245503

©2008 American Physical Society

Authors & Affiliations

Lorenz-M. Stadler1,*, Christian Gutt1, Tina Autenrieth1, Olaf Leupold1, Stefan Rehbein2, Yuriy Chushkin3, and Gerhard Grübel1

  • 1HASYLAB at DESY, Notkestr. 85, 22607 Hamburg, Germany
  • 2BESSY GmbH, Albert-Einstein-Str. 15, 12489 Berlin, Germany
  • 3ESRF, BP220, 38043 Grenoble Cedex, France

  • *lorenz.stadler@desy.de

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Issue

Vol. 100, Iss. 24 — 20 June 2008

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