Ab initio diffuse-interface model for lithiated electrode interface evolution

Maria E. Stournara, Ravi Kumar, Yue Qi, and Brian W. Sheldon
Phys. Rev. E 94, 012802 – Published 11 July 2016

Abstract

The study of chemical segregation at interfaces, and in particular the ability to predict the thickness of segregated layers via analytical expressions or computational modeling, is a fundamentally challenging topic in the design of novel heterostructured materials. This issue is particularly relevant for the phase-field (PF) methodology, which has become a prominent tool for describing phase transitions. These models rely on phenomenological parameters that pertain to the interfacial energy and thickness, quantities that cannot be experimentally measured. Instead of back-calculating these parameters from experimental data, here we combine a set of analytical expressions based on the Cahn-Hilliard approach with ab initio calculations to compute the gradient energy parameter κ and the thickness λ of the segregated Li layer at the LixSi-Cu interface. With this bottom-up approach we calculate the thickness λ of the Li diffuse interface to be on the order of a few nm, in agreement with prior experimental secondary ion mass spectrometry observations. Our analysis indicates that Li segregation is primarily driven by solution thermodynamics, while the strain contribution in this system is relatively small. This combined scheme provides an essential first step in the systematic evaluation of the thermodynamic parameters of the PF methodology, and we believe that it can serve as a framework for the development of quantitative interface models in the field of Li-ion batteries.

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  • Received 10 February 2016
  • Revised 22 May 2016

DOI:https://doi.org/10.1103/PhysRevE.94.012802

©2016 American Physical Society

Physics Subject Headings (PhySH)

General Physics

Authors & Affiliations

Maria E. Stournara1,†, Ravi Kumar1,†, Yue Qi2, and Brian W. Sheldon1

  • 1School of Engineering, Brown University, Providence, Rhode Island 02912, USA
  • 2Department of Chemical Engineering and Materials Science, Michigan State University, East Lansing, Michigan 48824, USA

  • *Corresponding authors: stournara@fhi-berlin.mpg.de, ravi_kumar@brown.edu
  • Equally contributing authors.

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Issue

Vol. 94, Iss. 1 — July 2016

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