Ab initio calculation of the ion feature in x-ray Thomson scattering

Kai-Uwe Plagemann, Hannes R. Rüter, Thomas Bornath, Mohammed Shihab, Michael P. Desjarlais, Carsten Fortmann, Siegfried H. Glenzer, and Ronald Redmer
Phys. Rev. E 92, 013103 – Published 6 July 2015

Abstract

The spectrum of x-ray Thomson scattering is proportional to the dynamic structure factor. An important contribution is the ion feature which describes elastic scattering of x rays off electrons. We apply an ab initio method for the calculation of the form factor of bound electrons, the slope of the screening cloud of free electrons, and the ion-ion structure factor in warm dense beryllium. With the presented method we can calculate the ion feature from first principles. These results will facilitate a better understanding of x-ray scattering in warm dense matter and an accurate measurement of ion temperatures which would allow determining nonequilibrium conditions, e.g., along shock propagation.

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  • Received 10 February 2015
  • Revised 13 May 2015

DOI:https://doi.org/10.1103/PhysRevE.92.013103

©2015 American Physical Society

Authors & Affiliations

Kai-Uwe Plagemann1,*, Hannes R. Rüter1, Thomas Bornath1, Mohammed Shihab1,2, Michael P. Desjarlais3, Carsten Fortmann4, Siegfried H. Glenzer5, and Ronald Redmer1

  • 1Institut für Physik, Universität Rostock, D-18051 Rostock, Germany
  • 2Physics Department, Faculty of Science, Tanta University, 31527 Tanta, Egypt
  • 3Sandia National Laboratories, Albuquerque, New Mexico 87185, USA
  • 4Quantumwise A/S, Lersø Parkallé 107, DK-2100 Copenhagen, Denmark
  • 5High Energy Density Science, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA

  • *kai-uwe.plagemann@uni-rostock.de

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Vol. 92, Iss. 1 — July 2015

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