Kinetic roughening and porosity scaling in film growth with subsurface lateral aggregation

F. D. A. Aarão Reis
Phys. Rev. E 91, 062401 – Published 9 June 2015

Abstract

We study surface and bulk properties of porous films produced by a model in which particles incide perpendicularly to a substrate, interact with deposited neighbors in its trajectory, and aggregate laterally with probability of order a at each position. The model generalizes ballisticlike models by allowing attachment to particles below the outer surface. For small values of a, a crossover from uncorrelated deposition (UD) to correlated growth is observed. Simulations are performed in 1+1 and 2+1 dimensions. Extrapolation of effective exponents and comparison of roughness distributions confirm Kardar-Parisi-Zhang roughening of the outer surface for a>0. A scaling approach for small a predicts crossover times as a2/3 and local height fluctuations as a1/3 at the crossover, independent of substrate dimension. These relations are different from all previously studied models with crossovers from UD to correlated growth due to subsurface aggregation, which reduces scaling exponents. The same approach predicts the porosity and average pore height scaling as a1/3 and a1/3, respectively, in good agreement with simulation results in 1+1 and 2+1 dimensions. These results may be useful for modeling samples with desired porosity and long pores.

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  • Received 10 March 2015

DOI:https://doi.org/10.1103/PhysRevE.91.062401

©2015 American Physical Society

Authors & Affiliations

F. D. A. Aarão Reis*

  • Instituto de Física, Universidade Federal Fluminense, Avenida Litorânea s/n, 24210-340 Niterói, Rio de Janeiro, Brazil

  • *reis@if.uff.br

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Vol. 91, Iss. 6 — June 2015

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